1) Improved Calculation of the Backscattering Factor for Quantitative Analysis by Auger Electron Spectroscopy , J. Appl. Phys. , 2006 , 99 (2006) 084903
2) Surface Excitation Probabilities in Surface Electron Spectroscopies , Surf. Sci. , 2006 , 600 (2006) 1526-1539
3) Monte Carlo Simulation of Secondary Electron and Backscattered Electron Images for a Nanoparticle-Matrix System , J. Phys. D: Appl. Phys. , 2005 , 38 (2005) 1966-1977
4) Application of Monte Carlo Simulation to SEM Image Contrast of Complex Structures , Surf. Interface Anal. , 2005 , 37 (2005) 912-918
5) Pressure Effect on the Photoluminescence and Raman Spectra Study of PPV , J. Lumines. , 2005 , 115 (2005) 32-38